Coherent interaction with two-level fluctuators using near field scanning microwave microscopy
نویسندگان
چکیده
منابع مشابه
Coherent interaction with two-level fluctuators using near field scanning microwave microscopy
Near field Scanning Microwave Microscopy (NSMM) is a scanning probe technique that non-invasively can obtain material properties on the nano-scale at microwave frequencies. While focus has been on developing room-temperature systems it was recently shown that this technique can potentially reach the quantum regime, opening up for applications in materials science and device characterization in ...
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ژورنال
عنوان ژورنال: Scientific Reports
سال: 2015
ISSN: 2045-2322
DOI: 10.1038/srep17176